韩建刚 cyberTECHNOLOGIES GmbH高级客户经理

Jiangang Han, Senior Account Manager, cyberTECHNOLOGIES GmbH

白光共焦技术在高端形貌测量中的应用

Advanced Surface Metrology for Semiconductor Industry: Implementing White-Light Confocal Technology

初新堂 南京中安半导体设备有限责任公司市场部副总经理

Seddy Chu, Marketing VP, Nanjing ZhongAn Semiconductor Equipment Co.,Ltd.

面向12寸先进集成电路制造的无图形颗粒检测设备的开发与应用

Development and Application of Non-Patterned Particle Inspection Systems for 12-Inch Advanced IC Manufacturing Processes

阎海滨 苏州天准科技股份有限公司副总经理

Coast Yan, Deputy Head of Suzhou TZTEK Technology Co.,Ltd.

国产明场纳米图形晶圆缺陷检测设备助力集成电路制造良率提升

Domestic Brightfield nano-patterned Wafer Defect Detection Equipment: Improving the yield of integrated circuit manufacturing.

张朝前 北京电子量检测装备有限责任公司产品总监

ZhangChaoqian, Product Director, Beijing Electronics Inspection and Metrology Equipment Co.,Ltd.

先进封装量测技术革新：3D高精度解决方案赋能异构集成时代

Innovation in Advanced Packaging Metrology: 3D High-Precision Solutions Empowering the Heterogeneous Integration Era

聂秋平 上海御微半导体技术有限公司事业部总经理

Richard NIE, General Manager of the Business Division, Yuwei Semiconductor Technology Co.,Ltd. 

猛禽御风五千里，Raptor助力光罩客户降本增效

Yuwei Raptor - A New Photomask Inspection Equipment to Support Customer Cost Down and Effiency Improvement

葛樑 爱德万测试（中国）管理有限公司业务发展总监

Ge Liang, Business Development Director of Advantest (China) Co.,Ltd. 

新兴芯片技术驱动下，芯片测试技术的需求演进和发展方向

Evolution Trends of Chip Testing Technology for New Semiconductor Wave

赵斯澄 西安和其光电科技股份有限公司产品总监

Sicheng Zhao, Product Director of Herch Opto Electronic Technology Co.,Ltd.

温度量测和光谱技术在半导体芯片制程中的应用

The Application of Temperature Measurement and Spectral Technology in Semiconductor Chip Manufacturing Processes